Subsystem HIL test bench

HiL test bench system to simulate subsystems

The subsystem test bench (STB) developed by CANWAY is a highly complex simulation system designed to test components and perform integration tests on electronic control units (ECUs) used in automotive environments. This is a so-called HiL test bench (Hardware in the Loop).

Contact form  | Phone 


Together with a well-known motor vehicle OEM, CANWAY designed, developed and produced the subsystem test bench that is today successfully being used in development departments. A complete subsystem, in this case the chassis and suspension is realistically visualized with the test bench. This consists of a whole range of electronic and mechanical components. Electronics modules as well as original components are combined to simulate signal variables (for example, wheel speed) in the test bench. As a consequence, the test engineer is able to extensively test and validate complex functions in the overall network of systems. The test bench is equipped with a modular rack system that allows sub-assemblies to be integrated, extended and altered according to requirements. A solution that recognizes and fulfils the dynamic demands associated with developing modern control units. The test bench boasts an integrated high-performance, real-time computer to facilitate realistic simulations; the computer is able to control and analyze bus systems commonly used throughout the automotive industry (for example: CAN, LIN, FlexRay, MOST, BroadR-Reach) in real time. It is also fundamentally possible to make available non-installed bus devices to the network of systems by means of a software-based restbus simulation. The entire system is connected to a user PC. That means the development engineer is able to perform extensive simulations on the test bench and immediately analyze their results.

Error prevention is a decisive focus of development as is the long-term reliability of the network of control units. With this in mind, CANWAY also offers the CW-300 series of test bench technology. Specifically designed to meet the demands placed on HiL test benches these high-performance modules cover a diverse range of measuring and control functions (M&C). The modules are equipped with suitable top-hat rail housings; they can also be integrated up front or retrofitted at any time without any difficulty. Several of these modules are installed in the subsystem test bench described here. For instance, there are multiple CW-322 low signal relay interfaces, CW-326 failure injection units (to provoke specific errors on data lines) and CW-311 wheel speed pulse conditioners (to simulate the wheel speed sensor) along with other modules in the test bench.